IMS 2018

Pennsylvania Convention Center, Philadelphia, PA

June 12-14 - Booth 1903


Certified since March 2010

ISO Cert

 

 

Test Capabilities

Unlike most thin-film manufacturing companies, DITF offers full DC-40 GHz Automatic Network Analyzer (AGILENT 8510) test capability.

Our engineering staff can create fixtures or perform wafer probing to ensure a compliant design the first time and every time in production.  Full S-parameter data or TDR plots can be provided. 

The DITF RF Testing lab contains a number of thin film substrate and module test fixtures that can be configured to perform non-destructive RF tests on substrates. These fixtures are adjustable in X, Y and Z directions and can support multiple input/output configurations.

Typical measurements include:

  1. Edge coupled filters
  2. Microstrip to Coplanar Waveguide (CPW) transitions
  3. Equalizers
  4. Couplers and Splitters
  5. Open/short continuity testing
  6. Microstrip, CPW  and Coupled line impedances
  7. TDR Line measurements (Impedance, discontinuities, terminations etc.)
  8. Attenuator Impedance and Attenuation value testing (DC and RF)

West Coast Sales

Glen Steward

(510) 468-7341

gsteward@ditf.com

East Coast Sales

Tom Lavallee

(603) 845-3450

tpl@ditf.com

DITF - Interconnect Technology

(775) 782-1041

sales@ditf.com

2245 Meridian Blvd.
Minden , NV 89423